Reactive Ion Etching, Multilayer Laue Lenses

Numéro d’image : 12629551
Reactive Ion Etching, Multilayer Laue Lenses
One way of focusing intense beams of x-rays down to individual nanometres involves bending them through the stacks of atomically thin materials inside multilayer Laue lenses (MLL). These drop-like domes were carved through a process called reactive ion etching, which produced the striped bubbles in this false-coloured electron microscope capture. Each dark line signified a marker layer built into these ultra precise lenses. This flawed prototype (the final lenses actually look much more like symmetrical towers) helped scientists perfect the synthesis process and prepare lenses to focus x-rays to within a single nanometre using instruments like Brookhaven's forthcoming National Synchrotron Light Source II.
Licence : Droits gérés
Crédit: Science Photo Library / Brookhaven National Laboratory
Taille de l’image : 4200 px × 2533 px
Model Release : Non requis
Property Release : Non requis
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