Transmission electron microscope (TEM), cut-away illustration. A TEM uses an electron beam to obtain an image of an object at a much higher concentration than can be obtained using light waves. The electrons travel down the microscope column and through the sample forming an image on a fluorescent plate beneath the column. | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Gaff, Karl |
Taille de l’image : | 4966 px × 7037 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : | - |