Ellipsometer, 3D illustration. An ellipsometer is used to measure the refractive index and thickness of a semi-transparent thin film. A laser (from left) is directed at the sample (blue) through a polariser. A detector and analyser (at right) intercept the light reflected from the sample. Changes in the polarisation of the light give information on the sample. | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Gaff, Karl |
Taille de l’image : | 3507 px × 2480 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : | - |