Colour enhanced Scanning Electron Micrograph (SEM) showing silicon beads on the head of a pin | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Texas Instruments |
Taille de l’image : | 3456 px × 2610 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : |
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