Mass spectrometer
Numéro d’image : 11902177
| Mass spectrometer. Laboratory equipment called a time of flight secondary ion mass spectrometer (TOF SIMS). The TOF SIMS is used to analyse the surface of a sample. The sensor array can be seen through the round window (lower left). A pulsed ion beam is used to remove molecules from the subject's surface. The molecules are ionised and accelerated towards a detector. The time it takes them to reach the detector depends on their mass. The advantage of this system is that macromolecules (such as polymers or proteins) are not disintegrated by the beam. TOF SIMS is used in coatings research,microelectronics and surface contamination studies | |
| Licence : | Droits gérés |
| Crédit: | Science Photo Library / Tek Image |
| Taille de l’image : | 4181 px × 4215 px |
| Model Release : | Non requis |
| Property Release : | Non requis |
| Restrictions : | - |
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