Scanning electron microscope. Scientist placing a sample (in forceps) into a scanning electron microscope (SEM). A SEM uses an electron beam to obtain a three-dimensional image of an object. The beam is scanned over the sample in a vacuum,causing the emission of secondary electrons. These secondary electrons are detected and used to form an image that will be displayed on a screen. Photographed at the University of Newcastle Upon Tyne,UK | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Cuthbert, Colin |
Taille de l’image : | 4923 px × 4969 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : | - |