Scanning electron microscope. Combined scanning electron microscope (SEM),scanning auger microsc- ope (SAM) and scanning probe microscope (SPM). The SEM scans a sample with an electron beam. The beam may be scattered off the sample or it may cause electrons to be emitted by it. These electrons are collected and translated into a three-dimensional image. The SAM can find the chemical composition of a sample on a microscopic scale. The SPM can image or alter material structures through the interaction of its probe with the material's surface. Photographed at the Centre for Nanoscale Science and Technology,University of Newcastle,England | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Cuthbert, Colin |
Taille de l’image : | 3351 px × 2574 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : | - |