False-colour scanning electron micrograph showing the twill weave pattern on a silk tie. Magnification: x18 at 35mm size | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Litchfield, R.E. |
Taille de l’image : | 3828 px × 2480 px |
Model Release : | Non requis |
Property Release : | Non requis |
Restrictions : | - |