Scanning electron microscope. Computer artwork of a scanning electron microscope (SEM) with an abstract background. An SEM uses an electron beam to obtain a three-dimensional image of an object at magnifications much higher than can be obtained using light waves. The beam is scanned over the sample in a vacuum,causing the emission of secondary electrons. These secondary electrons are detected and used to form the image,which is displayed on a screen | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / Xunbin, Pan |
Taille de l’image : | 5138 px × 3425 px |
Model Release : | Non requis |
Restrictions : | - |