Focused ion beam nanotechnology research. Close-up of a researcher preparing a focused ion beam (FIB) facility for use in a nanotechnology laboratory. This device is used for rapid nanostructuring of metallic, semiconducting and dielectric materials and devices. The resolution achieved is as small as 30 nanometres. Additional uses include high-resolution electron microscopy and electron beam lithography, beam-induced deposition of platinum, tungsten, carbon and silicon dioxide, and chemically accelerated milling of insulators. The helium ion microscope provides FIB milling down to scales below 10 nanometres. This research is being carried out in the Zepler Institute by the Nanophotonics and Metamaterials Group of the Optoelectronics Research Centre (ORC) at the University of Southampton, UK. Filmed in 2018.