Atomic force microscopy. Coloured scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load.Magnification: x2000 when printed at 10 centimetres wide. | |
Licence : | Droits gérés |
Crédit: | Science Photo Library / EYE OF SCIENCE |
Taille de l’image : | 4552 px × 3874 px |
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